A TESSELLATION MODEL FOR CRACK PATTERNS ON SURFACES

Authors

  • Werner Nagel
  • Joseph Mecke
  • Joachim Ohser
  • Viola Weiss

DOI:

https://doi.org/10.5566/ias.v27.p73-78

Keywords:

crack pattern, random tessellations, spatial statistics, stochastic geometry

Abstract

This paper presents a model of random tessellations that reflect several features of crack pattern. There are already several theoretical results derivedwhich indicate that thismodel can be an appropriate referencemodel. Some potential applications are presented in a tentative statistical study.

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Published

2011-05-03

Issue

Vol. 27 No. 2 (2008)

Section

Original Research Paper

How to Cite

Nagel, W., Mecke, J., Ohser, J., & Weiss, V. (2011). A TESSELLATION MODEL FOR CRACK PATTERNS ON SURFACES. Image Analysis and Stereology, 27(2), 73-78. https://doi.org/10.5566/ias.v27.p73-78

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