P. Donnadieu, K. Matsuda, T. Epicier, and J. Douin, “MEASUREMENTS OF STRAIN FIELDS DUE TO NANOSCALE PRECIPITATES USING THE PHASE IMAGE METHOD”, Image Anal Stereol, vol. 20, no. 3, pp. 213–218, May 2011, doi: 10.5566/ias.v20.p213-218.