Jernot, Jean-Paul, Patricia Jouannot-Chesney, Christian Lantuéjoul, Gérard Nouet, and Pierre Ruterana. 2011. “TOPOLOGICAL LOCALISATION OF DEFECTS AT ATOMIC SCALE”. Image Analysis and Stereology 21 (3): 191-98. https://doi.org/10.5566/ias.v21.p191-198.