Girard, Eric, Jean-Marc Chaix, François Valdivieso, Patrice Goeuriot, and Jacques Lechelle. 2011. “LOCAL STUDY OF DEFECTS DURING SINTERING OF UO2: IMAGE PROCESSING AND QUANTITATIVE ANALYSIS TOOLS”. Image Analysis and Stereology 27 (2): 79-85. https://doi.org/10.5566/ias.v27.p79-85.