GIRARD, Eric; CHAIX, Jean-Marc; VALDIVIESO, François; GOEURIOT, Patrice; LECHELLE, Jacques. LOCAL STUDY OF DEFECTS DURING SINTERING OF UO2: IMAGE PROCESSING AND QUANTITATIVE ANALYSIS TOOLS. Image Analysis and Stereology, [S. l.], v. 27, n. 2, p. 79–85, 2011. DOI: 10.5566/ias.v27.p79-85. Disponível em: https://ias-iss.org/ojs/IAS/article/view/833. Acesso em: 3 may. 2024.