LEÓN, Roberto; NAGEL, Werner; OHSER, Joachim; ARSCOTT, Steve. Modeling Crack Patterns by Modified STIT Tessellations. Image Analysis and Stereology, [S. l.], v. 39, n. 1, p. 33–46, 2020. DOI: 10.5566/ias.2245. Disponível em: https://ias-iss.org/ojs/IAS/article/view/2245. Acesso em: 30 apr. 2024.