KESTENER, Pierre; LINA, Jean Marc; SAINT-JEAN, Philippe; ARNEODO, Alain. WAVELET-BASED MULTIFRACTAL FORMALISM TO ASSIST IN DIAGNOSIS IN DIGITIZED MAMMOGRAMS. Image Analysis and Stereology, Ljubljana, Slovenia, v. 20, n. 3, p. 169–174, 2011. DOI: 10.5566/ias.v20.p169-174. Disponível em: https://ias-iss.org/ojs/IAS/article/view/674. Acesso em: 4 dec. 2024.